Reliability and Maintainability Assessment of Industrial Systems: Assessment of Advanced Engineering Problems

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· Springer Nature
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This book covers advanced reliability and maintainability knowledge as applied to recent engineering problems. It highlights research in the fields of reliability measures of binary and complex engineering systems, cost analysis, simulations, optimizations, risk factors, and sensitivity analysis. The book scrutinizes various advanced tools and techniques, methodology, and concepts to solve the various engineering problems related to reliability and maintainability of the industrial system at minimum cost and maximum profit. It consists of 15 chapters and offers a platform to researchers, academicians, professionals and scientists to enhance their knowledge and understanding the concept of reliability in engineering.

저자 정보

Prof. Dr. Mangey Ram received the Ph.D. degree major in Mathematics and minor in Computer Science from G. B. Pant University of Agriculture and Technology, Pantnagar, India. He has been a Faculty Member for around twelve years and has taught several core courses in pure and applied mathematics at undergraduate, postgraduate, and doctorate levels. He is currently the Research Professor at Graphic Era (Deemed to be University), Dehradun, India. Before joining the Graphic Era, he was a Deputy Manager (Probationary Officer) with Syndicate Bank for a short period. He is Editor-in-Chief of International Journal of Mathematical, Engineering and Management Sciences, Journal of Reliability and Statistical Studies, Editor-in-Chief of six Book Series with Elsevier, CRC Press-A Taylor and Frances Group, Walter De Gruyter Publisher Germany, River Publisher and the Guest Editor & Member of the editorial board of various journals. He has published 225 plus research publications (journal articles/books/book chapters/conference articles) in IEEE, Taylor & Francis, Springer, Elsevier, Emerald, World Scientific and many other national and international journals and conferences. Also, he has published more than 50 books (authored/edited) with international publishers like Elsevier, Springer Nature, CRC Press-A Taylor and Frances Group, Walter De Gruyter Publisher Germany, River Publisher. His fields of research are reliability theory and applied mathematics. Dr. Ram is a Senior Member of the IEEE, Senior Life Member of Operational Research Society of India, Society for Reliability Engineering, Quality and Operations Management in India, Indian Society of Industrial and Applied Mathematics, He has been a member of the organizing committee of a number of international and national conferences, seminars, and workshops. He has been conferred with “Young Scientist Award” by the Uttarakhand State Council for Science and Technology, Dehradun, in 2009. He has been awarded the “Best Faculty Award” in 2011; “Research Excellence Award” in 2015; and recently “Outstanding Researcher Award” in 2018 for his significant contribution in academics and research at Graphic Era Deemed to be University, Dehradun, India.

Dr. Hoang Pham is a Distinguished Professor and former Chairman (2007-2013) of the Department of Industrial and Systems Engineering at Rutgers University, New Jersey, USA. Before joining Rutgers, he was a Senior Engineering Specialist with the Boeing Company and the Idaho National Engineering Laboratory. He has been served as Editor-in-Chief, Editor, Associate Editor, Guest Editor and board member of many journals. He is the Editor of Springer Book Series in Reliability Engineering and has served as Conference Chair and Program Chair of over 40 international conferences. He is the author or coauthor of 6 books and has published over 190 journal articles, 100 conference papers and edited 15 books including Springer Handbook in Engineering Statistics and Handbook in Reliability Engineering. His numerous awards include the 2009 IEEE Reliability Society Engineer of the Year Award. He is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and the Institute of Industrial Engineers (IIE).

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