On-Line Testing for VLSI

· ·
· Frontiers in Electronic Testing 11. raamat · Springer Science & Business Media
E-raamat
160
lehekülge
Hinnangud ja arvustused pole kinnitatud.  Lisateave

Teave selle e-raamatu kohta

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Hinnake seda e-raamatut

Andke meile teada, mida te arvate.

Lugemisteave

Nutitelefonid ja tahvelarvutid
Installige rakendus Google Play raamatud Androidile ja iPadile/iPhone'ile. See sünkroonitakse automaatselt teie kontoga ja see võimaldab teil asukohast olenemata lugeda nii võrgus kui ka võrguühenduseta.
Sülearvutid ja arvutid
Google Playst ostetud audioraamatuid saab kuulata arvuti veebibrauseris.
E-lugerid ja muud seadmed
E-tindi seadmetes (nt Kobo e-lugerid) lugemiseks peate faili alla laadima ja selle oma seadmesse üle kandma. Failide toetatud e-lugeritesse teisaldamiseks järgige üksikasjalikke abikeskuse juhiseid.