Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield

This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies.

• Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques;
• Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view;
• Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.