• Novel methods and techniques for characterizing materials across a spectrum of systems and processes.
• Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of materials.
• Characterization of structural, morphological, and topographical natures of materials at micro- and nano- scales.
• Characterization of extraction and processing including process development and analysis.
• Advances in instrument developments for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM, FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques.• 2D and 3D modelling for materials characterization.